Improve Test Quality
Quick Instruments technology enhances functional test coverage as well as provides diagnostic data for troubleshooting.
Lower Test Development Costs
Functional Test development effort, time and cost reduction is achieved due to automation provided by the solution.
Reduce Test Escape Rate
The technology is targeting quality issues, marginal defects, timing related faults, performs BER/SNR estimations.
Quick Instruments can be seamlessly integrated into existing test flow (e.g. based on NI TestStand® or other test management software).
Bring-up Your Prototype Faster
Prototype bring-up becomes faster as the hardware validation and test can be done long before the product’s firmware is available to the HW design team.
Use a cloud-based compilation platform for instrument placement (fine-tuning) on target product/board.
At-speed test of interconnection lines between host and DDR memory device.
High speed serial links tester
Evaluate the quality of high-speed serial links (multi-gigabit connections, PCIe, optical fiber channel, etc)
Precise frequency measurement for on-board oscillators
Ethernet PHY tester
Functional and structural tests of Ethernet links on a board
Fast in-system flash programming tool
Communicate with I2C devices on your board
Test the interconnection between DDR4 memory and host device in Connectivity Test Mode.
During a prototype bring-up and Functional Test development phase, a product designer may use Quick Instruments to validate the prototype long before the product’s firmware is available.
When applied just prior to the main functional test phase, Quick Instruments would screen out defective parts without the need to run long-lasting functional and application tests.
Quick Instruments help to narrow down the defect caused functional test to fail, thereby shortening the repair and retest cycle, saving personnel costs, eliminating trial-and-error troubleshooting style and reducing the amount of unrepairable boards.