Quick Path from Fault Detection to Repair
Quick Instruments populate existing on-board FPGAs converting them temporarily into a fully-automated on-board embedded tester. No extra FPGA/DFT is needed - the existing device is used. What is more, FPGA design tools or expertise is not required too.
Instruments for everyone
The target functionality of Quick Instruments covers wide range of various test, measurement and ISP tasks such like ultra-fast Flash programming, precise clock measurements, at-speed test of memory interfaces (incl. DDR3/DDR4 memories) and I/O ports.
Outlier device detection
Peripheral bus test
Fast in-system programming
Improve Test Quality
Quick Instruments enhance functional test coverage and quality thanks to automatically controlled test synthesis process that guarantees target/maximum coverage level and provides diagnostic data for troubleshooting.
Lower Test Development Costs
Functional Test development effort, time and cost reduction is achieved due to automation provided by the solution. Now, the role of traditional functional test programs can be reduced to a simple fit-for-function proof.
Reduce Test Escape Rate
The technology is targeting quality issues, marginal defects, timing related faults, performs BER/SNR estimations. In volume production environment it helps to quickly identify outliers that may otherwise pass all standard tests.
Quick Instruments can be seamlessly integrated into existing test flow (e.g. based on NI TestStand® or other test management software). The technology supports and re-uses third-party T&M hardware (PXI I/O modules, 3rd-party I/O cards and cables) to access the electronic assembly under test.
Bring-up Your Prototype Faster
Prototype bring-up becomes faster as the hardware validation and test for defects and specifications can be done in automated way long before the product’s firmware is available to the HW design team.
Use a cloud-based compilation platform for instrument placement (fine-tuning) on target product/board.